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  1. Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition (Häftad)

    av

    Joseph Goldstein, Patrick Echlin, Dale E. Newbury, Joseph Goldstein, David C. Joy, David C. Joy

    ISBN: 9781461349693 - UTGIVEN: 2013-10

    Providing acomprehensive introduction to the capabilities and use of scanning electron microscopes (SEM) and x-ray spectrometers, this highly acclaimed text emphasizes practical aspects of imaging and analysis for a broad audience of studentsand practitioners whose backgrounds span a wide range of s[...]

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    från 733.00 kr
  2. Helium Ion Microscopy: Principles and Applications (Häftad)

    av

    David C. Joy

    ISBN: 9781461486596 - UTGIVEN: 2013-09

    "Helium Ion Microscopy: Principles and Applications" describes the theory and discusses the practical details of why scanning microscopes using beams of light ions such as the Helium Ion Microscope (HIM) are destined to become the imaging tools of choice for the 21st century. Topics covered include [...]

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    från 523.00 kr